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Bijay_Kumar Sharma
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SSPD_Chapter 6_Part 7_Introduction to ATHENA3_Process Simulator
(m37352)
Author:
Bijay_Kumar Sharma
Keywords:
Relax Parameter, Spacer Formation,True and False
Summary:
SSPD_Chapter 6_Part 7_Introduction to ATHENA3 deals with reducing the grid points
Subject:
Science and Technology
Language:
English
Popularity:
21.69%
Revised:
2011-04-01
Revisions:
New
SSPD_Chapter 6_Part 8_Caliberating ATHENA for typical MOSFET FLOW
(m37397)
Author:
Bijay_Kumar Sharma
Keywords:
Threshold voltage, quantum model,interstitial
Summary:
SSPD_Chapter 6_part 8 deals with setting the process parameters for simulating MOSFET device.
Subject:
Science and Technology
Language:
English
Popularity:
25.39%
Revised:
2011-04-06
Revisions:
New
SSPD_Chapter 6_Part 9_Appendix Device Physics
(m37428)
Author:
Bijay_Kumar Sharma
Keywords:
HeteroJunction Transistor,Fermi-level pinning, poly-silicon emitter, band-gap narrowing
Summary:
SSPD_Chapter 6_Part 9_Appendix on Device Physics describes the models used in ATLAS and ATHENA
Subject:
Science and Technology
Language:
English
Popularity:
32.66%
Revised:
2011-04-12
Revisions:
New
SSPD_Chapter 6_Part 9_Caliberating ATHENA for typical Bipolar Flow Process
(m37398)
Author:
Bijay_Kumar Sharma
Keywords:
Band Gap Narrowing, Injection level,
,
Surface Recombination Velocity
Summary:
SSPD_Chapter 6_Part 9_Caliberating ATHENA for typical Bipolar Flow Process. For this module a good understanding of the Physics of BJT is must.
Subject:
Science and Technology
Language:
English
Popularity:
19.63%
Revised:
2011-04-07
Revisions:
New
SSPD_Chapter 6_Part 9_Figure IX of Appendix on Device Physics
(m37429)
Author:
Bijay_Kumar Sharma
Keywords:
Poly-Si Emitter
Summary:
SSPD_Chapter 6_Part 9_Figure IX of the Appendix on Device Physics is being uploaded.
Language:
English
Popularity:
16.11%
Revised:
2011-04-12
Revisions:
New
SSPD_Chapter 7_Part 1_The Art of Microchip Fabrication transforms into HiTech Computer-Aided VLSI DESIGN and Microchip Fabrication.(Untitled)
(m38314)
Author:
Bijay_Kumar Sharma
Keywords:
Register Level, Logic Level, Circuit Level
Summary:
SSPD_Chapter 7 is concerned with the physical level design of VLSI Circuits. SSPD_Chapter 7_Part 1 deals with the level of Automation which has been achieved in the design of VLSI circuits.
Subject:
Science and Technology
Language:
English
Popularity:
48.27%
Revised:
2011-05-12
Revisions:
New
SSPD_Chapter 7_Part 2_BiCMOS Technology
(m38358)
Author:
Bijay_Kumar Sharma
Keywords:
BiCMOS,ECL, GaAs Technology
Summary:
SSPD_Chapter 7_Part 2 gives the necessity of introducing BiCMOS in CMOS circuitary and the technology of fabrication of NPN BJT n CMOS environment.
Subject:
Science and Technology
Language:
English
Popularity:
38.80%
Revised:
2011-05-17
Revisions:
New
SSPD_Chapter 7_Part 3_Basic Electrical Properties of MOS and MOS circuits to be continued1
(m38382)
Author:
Bijay_Kumar Sharma
Keywords:
Threshold voltage, pinch-off voltage,ohmic region, saturation region
Summary:
SSPD_Chapter 7_Part 3 gives the basic elecrical properties of MOS devices.
Subject:
Science and Technology
Language:
English
Popularity:
34.27%
Revised:
2011-05-19
Revisions:
New
SSPD_Chapter 7_Part 3_Basic Electrical Properties of MOScontinued6
(m38548)
Author:
Bijay_Kumar Sharma
Keywords:
Overlap,Oxide, Bulk
Summary:
SSPD_Chapter 7_Part 3_Basic Electrical Properties of MOScontinued6 describes the various capacitance associated NMOS in triode region, pentode region and in cut-off region.
Subject:
Science and Technology
Language:
English
Popularity:
41.72%
Revised:
2011-06-20
Revisions:
2
SSPD_Chapter 7_Part 3_Basic Electrical Properties of MOSFET_concluded.
(m38588)
Author:
Bijay_Kumar Sharma
Keywords:
Latching,trench isolation,guard rings, spacing,implants
Summary:
Chapter 7_Part 3_Conclusion module concludes the basic electrical properties of MOSFET by discussing the latch-up problem and its remedies.
Subject:
Science and Technology
Language:
English
Popularity:
35.73%
Revised:
2011-06-28
Revisions:
New
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