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About: The Application of VSI (Vertical Scanning Interferometry) to the Study of Crystal Surface Processes

Module by: Inna Kurganskaya, Andreas Luttge, Andrew R. Barron. E-mail the authors

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Metadata

Name: The Application of VSI (Vertical Scanning Interferometry) to the Study of Crystal Surface Processes
ID: m22326
Language: English (en)
Subject: Science and Technology
Keywords: AFM, morphology, SEM, structure, surface, Vertical Scanning Interferometry, VSI
License: Creative Commons Attribution License CC-BY 3.0
Authors: Inna Kurganskaya (iak2@rice.edu), Andreas Luttge (aluttge@rice.edu), Andrew R. Barron (arb@rice.edu)
Copyright Holders: Inna Kurganskaya (iak2@rice.edu), Andrew R. Barron (arb@rice.edu)
Maintainers: Inna Kurganskaya (iak2@rice.edu), Andrew R. Barron (arb@rice.edu)
Editors: Andreas Luttge (aluttge@rice.edu), Andrew R. Barron (arb@rice.edu)
Latest version: 1.4 (history)
First publication date: Apr 17, 2009 12:39 pm GMT-5
Last revision to module: Jul 13, 2009 5:08 pm GMT-5

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Version History

Version: 1.4 Jul 13, 2009 5:08 pm GMT-5 by Andrew R. Barron
Changes: 
no change
Version: 1.3 Jul 13, 2009 4:44 pm GMT-5 by Andrew R. Barron
Changes: 
no change
Version: 1.2 May 23, 2009 5:12 am GMT-5 by Andrew R. Barron
Changes: 
reformat refs
Version: 1.1 Apr 22, 2009 6:00 pm GMT-5 by Andrew R. Barron
Changes: 
re size figs

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  • the title of the work: The Application of VSI (Vertical Scanning Interferometry) to the Study of Crystal Surface Processes
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How to Cite and Attribute This Content

The following citation styles comply with the attribution requirements for the license (CC-BY 3.0) of this work:

American Chemical Society (ACS) Style Guide:

Kurganskaya, I.; Luttge, A.; Barron, A. The Application of VSI (Vertical Scanning Interferometry) to the Study of Crystal Surface Processes, Connexions Web site. http://cnx.org/content/m22326/1.4/, Jul 13, 2009.

American Medical Assocation (AMA) Manual of Style:

Kurganskaya I, Luttge A, Barron A. The Application of VSI (Vertical Scanning Interferometry) to the Study of Crystal Surface Processes [Connexions Web site]. July 13, 2009. Available at: http://cnx.org/content/m22326/1.4/.

American Psychological Assocation (APA) Publication Manual:

Kurganskaya, I., Luttge, A., & Barron, A. (2009, July 13). The Application of VSI (Vertical Scanning Interferometry) to the Study of Crystal Surface Processes. Retrieved from the Connexions Web site: http://cnx.org/content/m22326/1.4/

Chicago Manual of Style (Bibliography):

Kurganskaya, Inna, Andreas Luttge, and Andrew Barron. "The Application of VSI (Vertical Scanning Interferometry) to the Study of Crystal Surface Processes." Connexions. July 13, 2009. http://cnx.org/content/m22326/1.4/.

Chicago Manual of Style (Note):

Inna Kurganskaya, Andreas Luttge, and Andrew Barron, "The Application of VSI (Vertical Scanning Interferometry) to the Study of Crystal Surface Processes," Connexions, July 13, 2009, http://cnx.org/content/m22326/1.4/.

Chicago Manual of Style (Reference, in Author-Date style):

Kurganskaya, I., Luttge, A., & Barron, A. 2009. The Application of VSI (Vertical Scanning Interferometry) to the Study of Crystal Surface Processes. Connexions, July 13, 2009. http://cnx.org/content/m22326/1.4/.

Modern Languages Association (MLA) Style Manual:

Kurganskaya, Inna, Andreas Luttge, and Andrew Barron. The Application of VSI (Vertical Scanning Interferometry) to the Study of Crystal Surface Processes. Connexions. 13 July 2009 <http://cnx.org/content/m22326/1.4/>.